Publications by: Craig T. Jin
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Nguyen, Cong Dao, El Kass, Abdallah, Rahimi Azghadi, Mostafa, Jin, Craig T., Scott, Jonathan, and Leong, Philip H.W. (2017) An enhanced MOSFET threshold voltage model for the 6–300 K temperature range. Microelectronics Reliability, 69. pp. 36-39.