Measurements of thin resistive films employing split post dielectric resonator technique

Krupka, Jerzy, Jacob, Mohan, Givot, Bradley L., and Derzakowski, Krzysztof (2008) Measurements of thin resistive films employing split post dielectric resonator technique. In: Proceedings of MIKON 17th International Conference on Microwaves, Radar & Wireless Communications. pp. 892-895. From: MIKON 17th International Conference on Microwaves, Radar & Wireless Communications, 19-23 May 2008, Wroclaw, Poland.

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Abstract

Split post dielectric resonators have been used for measurements of the surface resistance of thin cermet and patterned metal films deposited on a thin low loss dielectric substrate.

Item ID: 7720
Item Type: Conference Item (Research - E1)
ISBN: 978-83-906662-7-3
Keywords: dielectric materials; microwave characterisation; permittivity; wireless communication
Date Deposited: 16 Jul 2010 04:43
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091208 Organic Semiconductors @ 100%
SEO Codes: 81 DEFENCE > 810104 Emerging Defence Technologies @ 40%
86 MANUFACTURING > 8610 Ceramics, Glass and Industrial Mineral Products > 861002 Ceramics @ 30%
89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890103 Mobile Data Networks and Services @ 30%
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