Mazierska, Janina, Jacob, Mohan V., and Krupka, Jerzy (2004) Precise microwave characterisation of materials for emerging technologies. In: Proceedings of Asia Pacific Microwave Conference 2004. pp. 1-4. From: Asia Pacific Microwave Conference, 15 - 18 December 2004, New Delhi, India.

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Abstract

Precise values of microwave parameters of materials are necessary for construction of novel microwave devices and circuits for wireless communication. To ensure accurate microwave characterization of superconducting and dielectric materials a novel measurement technique of unloaded Q-factor of microwave resonators has been developed and various types of dielectric resonators constructed. Several known and new materials including dielectrics (CaFz, LiTa03, YV03, LSAT, BaF2, Teflon, Rexolite and Polyethylene), often for the first time, and superconductors (YBazCu307 on differing substrates and doped with Ag, Tl(Ba,Sr)2Ca2Cu30y, MgB2) have been tested with a superior precision in a wide range of temperatures. This paper presents research outcomes of the Microwave Characterisation of Materials group lead by Janina Mazierska.

Item ID:	7695
Item Type:	Conference Item (Research - E1)
ISBN:	978-81-7764-722-8
Keywords:	dielectric materials; dielectric resonators; emerging technologies; loss tangent; permittivity
Date Deposited:	12 Jul 2010 23:43
FoR Codes:	09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%
SEO Codes:	89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 40% 91 ECONOMIC FRAMEWORK > 9105 Measurement Standards and Calibration Services > 910599 Measurement Standards and Calibration Services not elsewhere classified @ 40% 86 MANUFACTURING > 8616 Computer Hardware and Electronic Equipment > 861603 Integrated Circuits and Devices @ 20%
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