Investigations on microwave power dependence of high quality TI-1223 thin films on LSAT substrate

Jacob, M.V., Sundaresan, A., Mazierska, J., and Tanaka, Y. (2005) Investigations on microwave power dependence of high quality TI-1223 thin films on LSAT substrate. IEEE Transactions on Applied Superconductivity, 15 (2). pp. 3596-3599.

PDF (Published Version) - Published Version
Restricted to Repository staff only

DOI: 10.1109/TASC.2005.849368

View at Publisher Website: http://dx.doi.org/10.1109/TASC.2005.8493...

Abstract

The microwave power dependence of high quality Tl(Ba,Sr)2Ca2Cu3Oy thin films grown on 1'' diameter LSAT substrates using the Amorphous Phase Epitaxy method has been investigated in this paper. We have performed surface resistance (RS) measurements of Tl-1223 thin films on LSAT using the Hakki-Coleman sapphire dielectric resonator technique in the temperature range 15-94 K. High accuracy in measurements was achieved by using the multi-frequency Transmission Mode Q-Factor Technique. The Tl-1223 films exhibited low surface resistance comparable to YBCO films. When RF power levels were increased the onset of nonlinearity was observed at 0 dBm for all measured temperatures (17, 50, 70 and 84 K).


Item ID:	6396
Item Type:	Article (Research - C1)
ISSN:	1558-2515
Keywords:	high temperature superconductors; microwave characterisation; superconductivity; surface resistance; TI-1223; microwave properties
Date Deposited:	22 Jan 2010 01:39
FoR Codes:	09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%
SEO Codes:	97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 60% 86 MANUFACTURING > 8617 Communication Equipment > 861799 Communication Equipment not elsewhere classified @ 40%
Downloads:	Total: 7
	More Statistics

Actions (Repository Staff Only)

Item Control Page