Kazemi-Fard, Nazim, Ebrahimpour, Maryam, Rahimi, Mostafa, Tehrani, Mohammad, and Navi, Keivan (2008) Performance evaluation of in-circuit testing on QCA based circuits. In: Proceedings of the IEEE East-West Design & Test Symposium. pp. 375-378. From: EWDTS 08: IEEE East-West Design & Test Symposium, 9-12 October 2008, Lviv, Ukraine.

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Abstract

Quantum-Dot Cellular automata based circuits (QCA) are one of the favorite novel technologies, which operates on binary data at the nanometer-scale; in which logical operations and data movement are accomplished via Columbic interaction rather than electric current flow leading to a very little power dissipation. Since circuits made from QCA devices could provide various "wins" over CMOS, in recent years there has been an influx of QCA-related research. However before implementing every circuit, its testability and reliability must be mentioned. Hence, testing of these devices is our main concern in this paper and we will show how to perform In-Circuit-Testing on them and the differences and difficulties which is caused by the quantum entity of these circuits.

Item ID:	45708
Item Type:	Conference Item (Research - E1)
ISBN:	978-1-4244-3402-2
Date Deposited:	15 Aug 2017 23:36
FoR Codes:	09 ENGINEERING > 0906 Electrical and Electronic Engineering > 090604 Microelectronics and Integrated Circuits @ 100%
SEO Codes:	97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100%
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