Increasing testability in QCA circuits using a new test method

Adineh-Vand, A., Latif-Shabgahi, G., and Rahimi Azghadi, Mostafa (2008) Increasing testability in QCA circuits using a new test method. In: Proceedings of the 3rd International Design and Test Workshop. pp. 40-44. From: 2008 3rd International Design and Test Workshop, 20-22 December 2009, Monastir, Tunisia.

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Recently testing of Quantum-dot Cellular Automata circuits has attracted a lot of attentions. This paper proposes a novel method for testing QCA circuits. The method is based on circuit partitioning capability and multi-layer feature of QCA circuits. It can be useful for testing large circuits with many inputs. The proposed test method has potential to increase observability and controllability of QCA circuits, and hence it can amplify testability. In addition, it can be an effective method regarding to Built in Self Test (BIST) technique. Some simulations are performed using a QCA circuit layout and functionality checking tool, called QCADesigner.

Item ID: 45705
Item Type: Conference Item (Research - E1)
ISBN: 978-1-4244-3479-4
Date Deposited: 03 Aug 2017 02:45
FoR Codes: 09 ENGINEERING > 0906 Electrical and Electronic Engineering > 090601 Circuits and Systems @ 100%
SEO Codes: 97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100%
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