Precise microwave characterisation of YBa2Cu3O7−δ films on sapphire and lanthanum aluminate substrates

Jacob, Mohan V., and Mazierska, Janina (2003) Precise microwave characterisation of YBa2Cu3O7−δ films on sapphire and lanthanum aluminate substrates. Journal of Low Temperature Physics, 131 (3-4). pp. 647-651.

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Abstract

We have precisely measured the surface resistance (R S) of high quality YBCO thin films, deposited on Lanthanum Aluminate and Silver doped YBCO thin films on Cesium buffered Sapphire substrates using the Hakki-Coleman dielectric resonator at frequency of 10 GHz as a function of temperature from 25 K to 85 K. We have also studied the microwave power dependence of YBCO films on both substrates and the frequency dependence of films on LAO. Precise microwave characterisation of HTS films is needed for selection of best films for mobile phone base station receivers.

Item ID: 4452
Item Type: Article (Refereed Research - C1)
Keywords: dielectric resonators; high temperature superconductors; surface resistance
ISSN: 1573-7357
Date Deposited: 16 Jun 2009 23:01
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%
SEO Codes: 89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 80%
86 MANUFACTURING > 8616 Computer Hardware and Electronic Equipment > 861603 Integrated Circuits and Devices @ 20%
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