Surface resistance measurements of surface and interface sides of YBa2Cu3O7 films on sapphire and LaAlO3

Jacob, Mohan V., Mazierska, Janina, and Lorenz, Michael (2003) Surface resistance measurements of surface and interface sides of YBa2Cu3O7 films on sapphire and LaAlO3. Superconductor Science & Technology, 16 (3). pp. 412-415.

[img] PDF (Published Version)
Restricted to Repository staff only

View at Publisher Website: http://dx.doi.org/10.1088/0953-2048/16/3...
 
4
15


Abstract

We have measured the surface resistance of YBCO superconducting thin films deposited on sapphire and lanthanum aluminate substrates at the film side and at the interface between the substrate and the film. The measured difference in the Rs values of the interface and the film sides was between 30% and 60% for the YBCO films on LAO in the temperature range 15–80 K. For the Ag-doped films on sapphire the difference in Rs monotonically varied from 10% to 65% when temperature increased from 30 K to 80 K.

Item ID: 4450
Item Type: Article (Refereed Research - C1)
Keywords: dielectric resonators; high temperature superconductors; interfaces; surface resistance
ISSN: 1361-6668
Date Deposited: 16 Jun 2009 22:48
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%
SEO Codes: 89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 60%
86 MANUFACTURING > 8616 Computer Hardware and Electronic Equipment > 861603 Integrated Circuits and Devices @ 40%
Downloads: Total: 15
More Statistics

Actions (Repository Staff Only)

Item Control Page Item Control Page