Measurements of thin polymer films employing split post dielectric resonator technique

Jacob, Mohan, Krupka, Jerzy, Derzakowski, Krzysztof, and Mazierska, Janina (2006) Measurements of thin polymer films employing split post dielectric resonator technique. In: Proceedings of the 2006 International Conference on Microwaves, Radar & Wireless Communications. pp. 229-231. From: MIKON 2006 International Conference on Microwaves, Radar & Wireless Communications 2006, 22-24 May 2006, Krakow, Poland.

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Abstract

Split post dielectric resonator (SPDR) operating at frequency about 10 GHz has been used for measurements of permittivity and dielectric loss tangent of thin polymer films deposited on a thin low loss polymer substrate. Uncertainty analysis and experiments have shown that it is possible to measure real permittivity and dielectric loss tangent of thin polymer films deposited on thin low loss dielectric substrates. Appropriate sensitivity of measurements can be achieved by stacking several substrates with deposited film together and thus creating multilayered dielectric structure.

Item ID: 4308
Item Type: Conference Item (Research - E1)
ISBN: 978-83-906662-8-0
Keywords: permittivity; microwave loss; polymer thin films; loss tangent; dielectric properties; thin films
Date Deposited: 19 Nov 2009 01:48
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%
SEO Codes: 97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 60%
86 MANUFACTURING > 8617 Communication Equipment > 861799 Communication Equipment not elsewhere classified @ 40%
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