Low temperature and broadband dielectric properties of V(2)O(5) doped Mg(2)TiO(4) ceramics

Bhuyan, R.K., Kumar, T. Santhosh, Pamu, D., Renehan, J.M., and Jacob, M.V. (2014) Low temperature and broadband dielectric properties of V(2)O(5) doped Mg(2)TiO(4) ceramics. Materials Express, 4 (5). pp. 349-358.

[img] PDF (Published Version) - Published Version
Restricted to Repository staff only

View at Publisher Website: http://dx.doi.org/10.1166/mex.2014.1182


The liquid phase effect of V(2)O(5) on the densification, microstructure and microwave dielectric properties of Mg(2)TiO(4) (MTO) ceramics has been investigated. The addition of V(2)O(5) significantly lowered the sintering temperature compared to pure MTO ceramics with improved microstructure, relative density and microwave dielectric properties. The increase in relative density and average grain size via growth of large grains and dissolution of small grains is explained by Ostwald ripening phenomena. Further, the microwave dielectric properties of the pure and MTO with V(2)O(5) samples were measured at cryogenic temperatures. It was observed that the loss tangent (tan ) and Q × f o of pure MTO increased with temperature, whereas the loss tangent and Q × f o of the samples with V(2)O(5) decreased with a rise in temperature. However, the MTO ceramics added with 0.5 and 1.0 wt% of V(2)O(5) manifested slightly higher loss tangents as compared to the pure MTO ceramics. The mechanism of the microwave loss is in agreement with the theory of intrinsic dielectric loss derived from the two phonon difference process. Further, the distinctive loss peak at 40 K is attributed to the orientation polarization having dispersion at the microwave frequency. The addition of V(2)O(5) did not cause any changes on the temperature stability of the MTO ceramics, whereas the temperature coefficient of the permittivity increases with an increase in temperature. The broadband dielectric measurement reveals that the V(2)O(5) doping increases the dielectric constant and enhances the stability over a wide frequency range, and shows a peak around 1.8 GHz. The tan of pure MTO still shows the peak whereas the samples doped with V(2)O(5) suppresses this peak significantly.

Item ID: 36141
Item Type: Article (Research - C1)
ISSN: 2158-5857
Keywords: cryogenic temperatures, microwave dielectric properties, densification, microstructure
Funders: Defence Research & Development Organisation (DRDO), Department of Atomic Energy Board of Research in Nuclear Sciences (DAE-BRNS), Board Of Research in Fusion Science & Technology (BRFST), Department of Science and Technology of India (DST)
Projects and Grants: DRDO ERIP/ ER/0900371/M/01/1264, DAE-BRNS 2010/20/37P/14BRNS, DST SR/FTP/PS-109/2009
Date Deposited: 12 Nov 2014 11:14
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 50%
09 ENGINEERING > 0912 Materials Engineering > 091209 Polymers and Plastics @ 50%
SEO Codes: 85 ENERGY > 8598 Environmentally Sustainable Energy Activities > 859899 Environmentally Sustainable Energy Activities not elsewhere classified @ 50%
85 ENERGY > 8504 Energy Transformation > 850499 Energy Transformation not elsewhere classified @ 50%
More Statistics

Actions (Repository Staff Only)

Item Control Page Item Control Page