Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques

Krupka, J., Geyer, R.G., Baker-Jarvis, J., and Ceremuga, J. (1996) Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques. In: Proceedings of the Seventh International Conference on Dielectric Materials, Measurements and Applications, pp. 21-24. From: Seventh International Conference on Dielectric Materials, Measurements and Applications, 23-26 September 1996, Bath, UK.

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Abstract

The split dielectric resonator technique makes it possible to measure the real part of permittivity of isotropic materials for a very broad permittivity range and dielectric loss tangents in the range from 10⁻⁴ to 10⁻¹ with high accuracy. For uniaxially anisotropic materials, the split resonator method permits measurement of the permittivity and and the dielectric loss tangent in the plane parallel to the the sample bottoms. Additional measurements using re-entrant cavity enable determination of permittivity and the dielectric loss tangent perpendicular to this plane.

Item ID: 29427
Item Type: Conference Item (Research - E1)
ISBN: 978-0-85296-670-9
ISSN: 0537-9989
Date Deposited: 03 Oct 2013 02:17
FoR Codes: 10 TECHNOLOGY > 1005 Communications Technologies > 100505 Microwave and Millimetrewave Theory and Technology @ 60%
09 ENGINEERING > 0906 Electrical and Electronic Engineering > 090604 Microelectronics and Integrated Circuits @ 20%
09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 20%
SEO Codes: 97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 50%
97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 50%
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