Ceremuga, Janina, and Krupka, Jerzy (1996) Dielectric resonators for microwave characterization of high-temperature superconductors. In: Proceedings of SPIE: Oxide Superconductor Physics and Nano-Engineering II (2697) pp. 77-86. From: Oxide Superconductor Physics and Nano-Engineering II, 30 January - 2 February 1996, San Jose, CA, USA.

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Abstract

[Extract] Commercialisation of High Temperature Superconducting microwave circuits to communication systems depends on losses of HTS films exhibited at high frequencies. The losses must be much lower that those of conventional metallic films to compensate for the change of technology and need for cooling. Hence accurate measurements of surface resistance have been of primary importance almost since the discovery of High Temperature Superconductors in 1987. Resonant and direct transmission methods, used in the past for metals and Low Temperature Superconductors, have been employed for the microwave characterisation of YBaCuO, BiSrCaCuO and ThBaCaCuO films. After a copper cavity, a parallel plate resonator and a confocal resonator, recently a dielectric resonator has become the most popular technique for loss measurements of HTS films at microwave frequencies.

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