Microwave properties and microstructure of Y1Ba2Cu3O7 thin films

Savvides, Nick, Katsaros, Alex, Reilly, David, Foley, Cathy, Leong, Kenneth, and Ceremuga, Janina (1996) Microwave properties and microstructure of Y1Ba2Cu3O7 thin films. Czechoslovak Journal of Physics, 46 (2 Supplement). LT 21. pp. 1109-1110.

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The microwave properties of high-J(c) (~10⁶ A cm⁻²) c-axis Y₁Ba₂Cu₃O₇ this films on MgO(100) substrates were investigated as a function of the film microstructure. Measurements at 77 K, using a sapphire dielectric resonator operated in the TE₀₁₁ mode, show that the microwave surface resistance,R(s), at 10 GHz increases from 0.8 mΩ for very smooth films to 3–4 mΩ for films with large scale microstructural defects such as outgrowths and holes or pits. The unloaded quality factor Q(u) decreases from about 96,000 to below 50,000.

Item ID: 29423
Item Type: Article (Research - C1)
ISSN: 1572-9486
Additional Information:

Papers included in this supplement issue (Part S2: Superconductivity 1) are part of the proceedings of the 21st International Conference on Low Temperature Physics held Prague from August 8–14, 1996.

Date Deposited: 03 Oct 2013 02:10
FoR Codes: 02 PHYSICAL SCIENCES > 0204 Condensed Matter Physics > 020404 Electronic and Magnetic Properties of Condensed Matter; Superconductivity @ 70%
09 ENGINEERING > 0912 Materials Engineering > 091299 Materials Engineering not elsewhere classified @ 30%
SEO Codes: 97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 100%
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