Mazierska, Janina (1997) Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications. Journal of Superconductivity, 10 (2). pp. 73-84.

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Abstract

The performance of several designs of dielectric resonators used for microwave characterization of FITS films has been analyzed from the point of view of accuracy, sensitivity, and range. Designs discussed include Hakki-Coieman shielded types as well as open-ended resonators with sapphire, rutile and (ZrSn)TiO3 dielectrics. The best dielectric resonators have proved to have an uncertainty in surface resistance measurements only twice the uncertainty in the Q-factor. high sensitivity, and ability to measure a wide range of surface resistances. Hence the dielectric resonator technique can be considered as a standard for measurements of surface resistance of HTS films for wireless and PCS communication systems applications provided that adequate measurement procedures of the Q0-factor are followed.

Item ID:	28552
Item Type:	Article (Research - C1)
ISSN:	1572-9605
Keywords:	dielectric resonator, HTS films, surface resistance, microwave properties
Date Deposited:	03 Oct 2013 00:56
FoR Codes:	02 PHYSICAL SCIENCES > 0204 Condensed Matter Physics > 020401 Condensed Matter Characterisation Technique Development @ 60% 02 PHYSICAL SCIENCES > 0204 Condensed Matter Physics > 020404 Electronic and Magnetic Properties of Condensed Matter; Superconductivity @ 20% 09 ENGINEERING > 0906 Electrical and Electronic Engineering > 090699 Electrical and Electronic Engineering not elsewhere classified @ 20%
SEO Codes:	91 ECONOMIC FRAMEWORK > 9105 Measurement Standards and Calibration Services > 910599 Measurement Standards and Calibration Services not elsewhere classified @ 20% 86 MANUFACTURING > 8615 Instrumentation > 861503 Scientific Instruments @ 50% 97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 30%
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