Analysis of high frequency properties of multilayer structures for multichip modules
Mazierska, Janina E., and Allen, Gregory H. (1998) Analysis of high frequency properties of multilayer structures for multichip modules. Applied Superconductivity, 4 (12). pp. 635-643.
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Abstract
The microwave surface resistance and reactance of YBa₂Cu₃O₇ multilayers for MCMs have been studied as a function of thickness and relative permittivity of dielectric layers at 500 MHz and 10 GHz propagation frequency. Additionally, frequency properties of a YBCO/CeO₂/SrTiO₃/YBCO/LaAlO₃ multilayer have been analyzed and results compared with measurement results. Performed simulations have shown that a dielectric layer of high relative permittivity, necessary for good isolation between superconducting ground planes and power planes in the multichip modules, has negligible influence on the effective surface resistance and reactance up to 0.5 μm dielectric thickness.
| Item ID: | 28287 |
|---|---|
| Item Type: | Article (Research - C1) |
| ISSN: | 0964-1807 |
| Date Deposited: | 22 Aug 2013 23:04 |
| FoR Codes: | 09 ENGINEERING > 0906 Electrical and Electronic Engineering > 090604 Microelectronics and Integrated Circuits @ 90% 09 ENGINEERING > 0912 Materials Engineering > 091202 Composite and Hybrid Materials @ 10% |
| SEO Codes: | 97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100% |
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