Improvement of accuracy in measurements of the surface resistance of superconductors using dielectric resonators

Krupka, Jerzy, and Mazierska, Janina (1998) Improvement of accuracy in measurements of the surface resistance of superconductors using dielectric resonators. IEEE Transactions on Applied Superconductivity, 8 (4). pp. 164-167.

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Abstract

Two techniques to minimize the influence of parasitic losses on surface resistance measurements of superconductors employing dielectric resonators have been described. The first method optimizes the sapphire resonator aspect ratio to minimize the parasitic losses for given superconductor sample dimensions and measurement frequency. The second utilizes a reference resonator with a perfect conductor plane to cancel out the influence of parasitic losses by measurements of the resonant frequencies and Q-factors of two resonators. The second technique is recommended when materials having noticeable dielectric losses are used to construct dielectric resonators.

Item ID: 28144
Item Type: Article (Research - C1)
ISSN: 1558-2515
Keywords: aspect ratio, crystal resonators, dielectric devices, dielectric losses, dielectric resonators, electric resistance measurement, natural frequencies, parasitic losses, Q factor measurement, rutile dielectric resonator, sapphire, superconducting materials, surface resistance measurements
Date Deposited: 07 Aug 2013 23:25
FoR Codes: 02 PHYSICAL SCIENCES > 0204 Condensed Matter Physics > 020401 Condensed Matter Characterisation Technique Development @ 80%
02 PHYSICAL SCIENCES > 0204 Condensed Matter Physics > 020404 Electronic and Magnetic Properties of Condensed Matter; Superconductivity @ 20%
SEO Codes: 86 MANUFACTURING > 8615 Instrumentation > 861503 Scientific Instruments @ 50%
97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 25%
97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 25%
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