Mazierska, Janina (2009) Microwave characterization of materials for telecommunication systems. In: Proceedings of the 2009 IEEE Youth Conference on Information, Computing and Telecommunications. P-01. p. 1. From: YC-ICT 2009: 2009 IEEE Youth Conference on Information, Computing and Telecommunications, 20-21 September 2009, Bejing, China.

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Abstract

Novel low loss materials are needed to achieve miniaturization and further advances in wireless communications with precisely known microwave properties. Measurements of complex permittivity of low loss dielectric materials (especially anisotropic) in a wide range of temperatures still represent a challenging issue. Accuracy of surface resistance tests of superconducting materials can be low in some cases, and characterization of metamaterials is done only for one polarization and one incident angle, what is rather unsatisfactory. Accuracy of measurements is also determined by accuracy in determination of unloaded Qo-factor of test fixtures. Hence progress in microwave characterization of novel materials is also necessary. In this presentation a review of test resonators and a precise technique to measure the Qo-factor will be given. Also measurement results of complex permittivity of several low loss dielectrics and High Temperature superconducting materials will be shown.

Item ID:	27994
Item Type:	Conference Item (Abstract / Summary)
ISBN:	978-1-4244-5074-9
Date Deposited:	15 Jul 2013 02:46
FoR Codes:	09 ENGINEERING > 0906 Electrical and Electronic Engineering > 090699 Electrical and Electronic Engineering not elsewhere classified @ 70% 09 ENGINEERING > 0912 Materials Engineering > 091299 Materials Engineering not elsewhere classified @ 30%
SEO Codes:	97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100%
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