Measurements of intrinsic losses of high temperature superconducting thin films: surface resistance and conductivity

Mazierska, Janina, Krupka, Jerzy, and Wosik, J. (2012) Measurements of intrinsic losses of high temperature superconducting thin films: surface resistance and conductivity. In: International Symposium on High Temperature Superconductors in High Frequency Fields. pp. 7-8. From: 11th International Symposium on High Temperature Superconductors in High Frequency Fields, 29 May - 1 June 2012, Yamagata University, Japan.

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Abstract

[Extract] Research devoted to measurements of dc amd ac losses of HTS materials in bulk, thick and thin film forms followed immediately their discover twenty five years ago [1]. Apart from pure love of scientific discovery this interest was also driven by possible HTS mass market applications. The dc resistance was measured by the four probe technique [2]. But for testing of surface resistance several measurement techniques used before for Low Temperature Superconducting films, metallic films and dielectric materials have been trialed by various groups [3-13].

Item ID: 26505
Item Type: Conference Item (Abstract / Summary)
Keywords: superconductivity, microwave measurements, surface resistance, conductivity
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The first author was an Invited Speaker for HTSHFF2012

Date Deposited: 02 May 2013 04:29
FoR Codes: 02 PHYSICAL SCIENCES > 0204 Condensed Matter Physics > 020404 Electronic and Magnetic Properties of Condensed Matter; Superconductivity @ 80%
09 ENGINEERING > 0906 Electrical and Electronic Engineering > 090699 Electrical and Electronic Engineering not elsewhere classified @ 10%
09 ENGINEERING > 0912 Materials Engineering > 091299 Materials Engineering not elsewhere classified @ 10%
SEO Codes: 97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 100%
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