Optical properties of thermally evaporated PDI-8CN2 thin films
Anderson, L., Di Girolamo, F., Barra, M., Cassinese, A., and Jacob, M.V. (2011) Optical properties of thermally evaporated PDI-8CN2 thin films. Physics Procedia, 14. pp. 29-33.
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Abstract
The optical properties of thermally evaporated PDI-8CN2 thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 – 900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations.
| Item ID: | 21166 |
|---|---|
| Item Type: | Article (Research - C1) |
| ISSN: | 1875-3892 |
| Keywords: | perylene; optical anisotropy; ellipsometry |
| Date Deposited: | 25 Mar 2012 23:38 |
| FoR Codes: | 09 ENGINEERING > 0912 Materials Engineering > 091208 Organic Semiconductors @ 100% |
| SEO Codes: | 97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100% |
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