Mazierska, Janina, McGrath, Jonathon, and Jacob, Mohan V. (2002) Accuracy comparison of the multifrequency and the three frequencies computations of loss tangent and relative permittivity of low loss dielectric materials using the dielectric resonator technique. In: Proceedings of the 2002 Asia-Pacific Microwave Conference. From: 2002 Asia-Pacific Microwave Conference (APMC 2002), 19-22 November 2002, Kyoto, Japan.

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Abstract

This paper discusses the measurement accuracy of the loss tangent and the relative permittivity of low loss dielectrics. Typically used the "3 dB" method combined with the "Insertion Loss" computations has been compared with the more precise Transmission Mode QFactor Technique for measurements of tan of Rexolite, Polyethylene, LSAT, CaF₂, Teflon, YVO₄ and SLAO at room temperature. Also for teflon, rexolite and polyethylene we conducted the comparison for temperatures from 24K to 84K. For teflon (with tan below 6·10₋₆) errors up to 100% have been obtained; but for dielectric with tan above 5·10₋₅, errors were below 5%. For ∑(r) measurements, errors introduced by the thermal expansion coefficient have been analysed and found to be between 2.4% and 3.5%.

Item ID:	14683
Item Type:	Conference Item (Research - E1)
Keywords:	dielectrics; loss tangent; microwave characterisation; TMQF
Related URLs:	Organisation
Additional Information:	"Microwave renaissance launched from Kyoto" [on front of CD-ROM]
Date Deposited:	26 Oct 2012 03:20
FoR Codes:	10 TECHNOLOGY > 1005 Communications Technologies > 100505 Microwave and Millimetrewave Theory and Technology @ 70% 09 ENGINEERING > 0912 Materials Engineering > 091209 Polymers and Plastics @ 30%
SEO Codes:	89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 100%
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