Microwave characterisation of superconducting materials: what accuracy can be achieved in surface resistance measurements using the Hakki-Coleman dielectric resonators?

Mazierska, J., Leong, K.T., and Jacob, M.V. (2000) Microwave characterisation of superconducting materials: what accuracy can be achieved in surface resistance measurements using the Hakki-Coleman dielectric resonators? In: Proceedings of the 2000 Asia-Pacific Microwave Conference, pp. 608-611. From: 2000 Asia-Pacific Microwave Conference, 3-6 December 2000, Sydney, NSW, Australia.

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Abstract

This paper discusses accuracy of loss measurements of High Temperature Superconductors (HTS) using the Hakki-Coleman sapphire resonator. Possible sources of errors in Rs measurements are presented and evaluated. It has been shown that in order to minimise ΔRs/Rs errors the fractional power ratios should be below 0.1. This can be achieved by appropriate aspect ratio of the sapphire and the cavity to sapphire diameter ratio. For optimised designs errors in Rs measurements can be as small as 1.5 times the measurement error in the Q0-factor even for 100% uncertainty in tanδ

Item ID: 14531
Item Type: Conference Item (Refereed Research Paper - E1)
Keywords: Dielectric Resonators; High Temperature Superconductors; Q-Factor; Superconductors
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ISBN: 978-0-7803-6435-6
Date Deposited: 03 Sep 2012 02:14
FoR Codes: 10 TECHNOLOGY > 1005 Communications Technologies > 100505 Microwave and Millimetrewave Theory and Technology @ 100%
SEO Codes: 89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 100%
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