Jacob, Mohan V. (2009) Non-destructive dielectric characterization techniques using electromagnetic waves. In: Proceedings of 12th International Symposium on Microwave and Optical Technology. 339- 342. From: 12th International Symposium on Microwave and Optical Technology, 16 - 19 December 2009, New Delhi, India.

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Abstract

Microwave characterization is an important tool to characterize different materials precisely and often non-destructively. Number of evaluation techniques have been implemented but the suitability and accuracy of each technique can be categorized as transmission and/or reflection methods, resonance methods and free-space methods. The measured dielectric properties of materials generally show discrepancies when data from free space, resonant cavity or transmission line measurements are obtained. This paper will discuss various methods used for the microwave evaluations of materials especially dielectric and metallic samples.

Item ID:	11234
Item Type:	Conference Item (Research - E1)
ISBN:	978-0-230-32846-4
Keywords:	dielectric materials; microwave characterization; permittivity; loss tangent
Date Deposited:	18 May 2010 03:04
FoR Codes:	09 ENGINEERING > 0912 Materials Engineering > 091208 Organic Semiconductors @ 100%
SEO Codes:	97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100%
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