Loss tangent measurements of dielectic substrates from 15K to 300K with two resonators: investigation into accuracy issues

Mazierska, Janina, Jacob, Mohan V., Ledenyov, Dimitri, and Krupka, Jerzy (2005) Loss tangent measurements of dielectic substrates from 15K to 300K with two resonators: investigation into accuracy issues. In: Proceedings of Asia Pacific Microwave Conference 2005, pp. 2370-2373. From: Asia Pacific Microwave Conference 2005, 4-7 December 2005, Suzhou, China.

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Abstract

Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880 and 6010.2, LaAlO3, LSAT, MgO and quartz) was measured at varying temperatures with two TE01δ dielectric resonators to ensure verification of the tests. Accuracy of the measurements has been investigated and discussed for a superconducting single post and a copper split post resonators in a temperature range from 15K to 300K

Item ID: 7712
Item Type: Conference Item (Refereed Research Paper - E1)
Keywords: dielectric properties; dielectric resonators; loss tangent; microwave characterisation; permittivity
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ISBN: 0-7803-9434-8
Date Deposited: 25 Jan 2010 00:11
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%
SEO Codes: 97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 60%
86 MANUFACTURING > 8617 Communication Equipment > 861799 Communication Equipment not elsewhere classified @ 40%
Citation Count from Scopus Scopus 1
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