Low temperature microwave characterisation of lithium fluoride

Jacob, Mohan V. (2004) Low temperature microwave characterisation of lithium fluoride. In: Proceedings of Asia Pacific Microwave Conference 2004, pp. 1-4. From: Asia Pacific Microwave Conference, 15 - 18 December 2004, New Delhi, India.

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Abstract

Precise knowledge of dielectric properties of materials is required to implement the material in devices and circuits. At microwave frequencies complex permittivity (dielectric constant and loss tangent) are the two mandatory parameters prior to any design. We have identified Lithium Fluoride as a potential candidate, which can be used in conjunction with superconducting and non-superconducting parts of several microwave communication devices. Even though dielectric constant of LiF is known at room temperature there is no data presented at cryogenic temperatures. In this paper we have reported the dielectric constant and loss tangent of LiF as a function of temperature (19-295K) and at a frequency of 8 GHz.

Item ID: 7694
Item Type: Conference Item (Refereed Research Paper - E1)
Keywords: dielectric resonators; lithium fluoride; loss tangent; permittivity
ISBN: 978-81-7764-722-8
Date Deposited: 01 Jul 2010 04:15
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%
SEO Codes: 89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 50%
91 ECONOMIC FRAMEWORK > 9105 Measurement Standards and Calibration Services > 910599 Measurement Standards and Calibration Services not elsewhere classified @ 30%
86 MANUFACTURING > 8616 Computer Hardware and Electronic Equipment > 861603 Integrated Circuits and Devices @ 20%
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