Precise microwave characterisation of low loss dielectrics

Mazierska, Janina, Krupka, Jerzy, and Jacob, Mohan V. (2005) Precise microwave characterisation of low loss dielectrics. In: Papers from Microwave Workshops and Exhibition MWE2005, pp. 295-300. From: Microwave Workshops and Exhibition MWE2005, 9 -11 November 2005, Yokohama, Japan.

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Abstract

Measurements of complex permittivity of low loss dielectric materials (especially anisotropic) in a wide range of temperatures still represent a challenging issue. For bulk samples Whispering Gallery Modes can be used, but planar dielectrics can only be measured using TEol1 and TE018 resonators. Accuracy of tanO measurements is also determined by accuracy in determination of unloaded Qo-factor of test fixtures. This paper presents a review of resonators, a precise technique to measure the Qo factor and measurement results of complex permittivity of several low loss dielectrics.

Item ID: 7666
Item Type: Conference Item (Refereed Research Paper - E1)
Keywords: dielectric properties; lithium fluoride; loss tangent; permittivity
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ISBN: 978-4-902339-07-9
Date Deposited: 22 Jun 2010 04:56
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%
SEO Codes: 97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 60%
86 MANUFACTURING > 8617 Communication Equipment > 861799 Communication Equipment not elsewhere classified @ 40%
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