Complex permittivity measurements at viable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators
Mazierska, Janina, Krupka, Jerzy, Jacob, Mohan V., and Ledenyov, Dimitri (2004) Complex permittivity measurements at viable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators. In: Proceedings of 2004 IEEE MTT-S International Microwave Symposium Digest (3) pp. 1825-1828. From: 2004 International Microwave Symposium, 6 -11 June 2004, Fort Worth, Texas, USA.
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Abstract
A split post dielectric resonator in a copper enclosure and a single post dielectric resonator in a cavity with superconducting end-plates have been constructed and used for the complex permittivity measurements of single crystal substrates. (La,Sr)(Al,Ta)O3, LaAlO3, MgO and quartz substrates have been measured at temperatures from 20 K to 300 K in the split post resonator and from 15 K to 80 K in the single post resonator. The TE01δ mode resonant frequencies and unloaded Q0-factors of the empty resonators at temperature of 20 K were: 9.952 GHz and 25,000 for the split post resonator and 10.808 GHz and 240,000 for the single post resonator respectively
| Item ID: | 7516 |
|---|---|
| Item Type: | Conference Item (Research - E1) |
| ISBN: | 0-7803-8331-1 |
| Keywords: | dielectric materials; dielectric resonators; loss tangent; permittivity; split post dielectric resonator |
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| Date Deposited: | 05 Feb 2010 02:44 |
| FoR Codes: | 09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100% |
| SEO Codes: | 89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 50% 91 ECONOMIC FRAMEWORK > 9105 Measurement Standards and Calibration Services > 910599 Measurement Standards and Calibration Services not elsewhere classified @ 30% 86 MANUFACTURING > 8616 Computer Hardware and Electronic Equipment > 861603 Integrated Circuits and Devices @ 20% |
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