Mazierska, Janina (1997) Sapphire and rutile dielectric resonators for measurements of surface resistance of superconducting thin films. In: 1997 Asia-Pacific Microwave Conference Proceedings (1) pp. 125-128. From: APMC 1997: 1997 Asia-Pacific Microwave Conference, 2-5 December 1997, Hong Kong.

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Abstract

Dielectric resonators are widely used for measurements of surface resistance of High Temperature Superconducting films for cellular and PCS filters. This paper discusses properties of two 10 GHz resonators; a sapphire Hakki-Coleman resonator and an open ended rutile resonator in terms of their suitability and accuracy for microwave characterisation of HTS films.

Item ID:	28551
Item Type:	Conference Item (Research - E1)
ISBN:	978-0-7803-4288-0
Date Deposited:	03 Oct 2013 00:33
FoR Codes:	02 PHYSICAL SCIENCES > 0204 Condensed Matter Physics > 020401 Condensed Matter Characterisation Technique Development @ 60% 02 PHYSICAL SCIENCES > 0204 Condensed Matter Physics > 020404 Electronic and Magnetic Properties of Condensed Matter; Superconductivity @ 20% 09 ENGINEERING > 0906 Electrical and Electronic Engineering > 090699 Electrical and Electronic Engineering not elsewhere classified @ 20%
SEO Codes:	86 MANUFACTURING > 8615 Instrumentation > 861503 Scientific Instruments @ 70% 97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 30%
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