Optical properties of thermally evaporated PDI-8CN2 thin films

Anderson, L., Di Girolamo, F., Barra, M., Cassinese, A., and Jacob, M.V. (2011) Optical properties of thermally evaporated PDI-8CN2 thin films. Physics Procedia, 14. pp. 29-33.

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Abstract

The optical properties of thermally evaporated PDI-8CN2 thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 – 900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations.

Item ID: 21166
Item Type: Article (Refereed Research - C1)
Keywords: perylene; optical anisotropy; ellipsometry
ISSN: 1875-3892
Date Deposited: 25 Mar 2012 23:38
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091208 Organic Semiconductors @ 100%
SEO Codes: 97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100%
Citation Count from Web of Science Web of Science 2
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