Optical properties of thermally evaporated PDI-8CN2 thin films

Anderson, L., Di Girolamo, F., Barra, M., Cassinese, A., and Jacob, M.V. (2011) Optical properties of thermally evaporated PDI-8CN2 thin films. Physics Procedia, 14. pp. 29-33.

[img] PDF (Published Version) - Published Version
Restricted to Repository staff only

View at Publisher Website: http://dx.doi.org/10.1016/j.phpro.2011.0...


The optical properties of thermally evaporated PDI-8CN2 thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 – 900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations.

Item ID: 21166
Item Type: Article (Refereed Research - C1)
Keywords: perylene; optical anisotropy; ellipsometry
ISSN: 1875-3892
Date Deposited: 25 Mar 2012 23:38
FoR Codes: 09 ENGINEERING > 0912 Materials Engineering > 091208 Organic Semiconductors @ 100%
SEO Codes: 97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100%
Citation Count from Web of Science Web of Science 2
Downloads: Total: 3
More Statistics

Actions (Repository Staff Only)

Item Control Page Item Control Page