Novel method for calculation and measurement of unloaded Q-factor of superconducting dielectric resonators
Jacob, M.V., Mazierska, J., Leong, K., and Krupka, J. (2001) Novel method for calculation and measurement of unloaded Q-factor of superconducting dielectric resonators. In: Microwave Symposium Digest 2001 (3), pp. 1993-1996. From: 2001 IEEE MTT-S International Microwave Symposium, 20-25 May 2001, Phonenix, AZ.
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The dielectric resonator technique is recognised as the best method for the measurement of surface resistance (Rs) of High Temperature Superconducting thin films. The Rs is calculated from the Unloaded Q-factor (Q0) of the resonator, and to obtain accurate values of the Q0-factor multi-frequency measurements of S21, S11 and S22 and data circle fitting are required. As a result, surface resistance measurements at varying temperatures are very time consuming. In this paper we introduce a simplified method for calculations the Q0-factor, which require measurements of S11 and S 22 at the lowest temperature only. For all other temperatures only S21 measurements are needed. The method has shown to give sufficiently accurate Q0 values and hence the surface resistance.
|Item Type:||Conference Item (Refereed Research Paper - E1)|
|Keywords:||Dielectric Resonators; Measurements; Q-Factor|
|Date Deposited:||29 Aug 2012 02:51|
|FoR Codes:||10 TECHNOLOGY > 1005 Communications Technologies > 100505 Microwave and Millimetrewave Theory and Technology @ 100%|
|SEO Codes:||89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 100%|