Novel method for calculation and measurement of unloaded Q-factor of superconducting dielectric resonators

Jacob, M.V., Mazierska, J., Leong, K., and Krupka, J. (2001) Novel method for calculation and measurement of unloaded Q-factor of superconducting dielectric resonators. In: Microwave Symposium Digest 2001 (3), pp. 1993-1996. From: 2001 IEEE MTT-S International Microwave Symposium, 20-25 May 2001, Phonenix, AZ.

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Abstract

The dielectric resonator technique is recognised as the best method for the measurement of surface resistance (Rs) of High Temperature Superconducting thin films. The Rs is calculated from the Unloaded Q-factor (Q0) of the resonator, and to obtain accurate values of the Q0-factor multi-frequency measurements of S21, S11 and S22 and data circle fitting are required. As a result, surface resistance measurements at varying temperatures are very time consuming. In this paper we introduce a simplified method for calculations the Q0-factor, which require measurements of S11 and S 22 at the lowest temperature only. For all other temperatures only S21 measurements are needed. The method has shown to give sufficiently accurate Q0 values and hence the surface resistance.

Item ID: 14583
Item Type: Conference Item (Refereed Research Paper - E1)
Keywords: Dielectric Resonators; Measurements; Q-Factor
ISBN: 978-0-7803-6538-4
ISSN: 0149-645X
Date Deposited: 29 Aug 2012 02:51
FoR Codes: 10 TECHNOLOGY > 1005 Communications Technologies > 100505 Microwave and Millimetrewave Theory and Technology @ 100%
SEO Codes: 89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 100%
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