Accurate measurements of surface resistance of HTS films using a novel transmission mode Q-factor technique

Leong, Kenneth, and Mazierska, Janina (2001) Accurate measurements of surface resistance of HTS films using a novel transmission mode Q-factor technique. Journal of Superconductivity, 14 (1). pp. 93-103.

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Abstract

Microwave characterization of HTS films, using typically a sapphire dielectric resonator can only be as accurate as the Q0-factor and fres measurements. A novel Transmission Mode Q-Factor (TMQF) technique has been used for accurate measurements of surface resistance of YBa2Cu3O7 films, with errors lower than 1%. The method allows for accurate determination of QL, β1, and β2 based on novel equations and a multi-frequency circle-fitting technique applied to S21, S11, and S22 measured around the resonance. Parasitic effects introduced by real measurement systems, namely, noise, crosstalk, coupling loss, coupling reactance, and electrical delay due to uncalibrated transmission lines are compensated for in the new method. Range of unloaded Q0-factors that can be measured with the TMQF technique is assessed to be from 100 to 10 million at the GHz range of frequencies.

Item ID: 13282
Item Type: Article (Refereed Research - C1)
Keywords: dielectric resonators; HTS filmsmicrowave measurements; Q-factor; surface resistance
ISSN: 1557-1947
Date Deposited: 30 Jul 2012 04:02
FoR Codes: 10 TECHNOLOGY > 1005 Communications Technologies > 100505 Microwave and Millimetrewave Theory and Technology @ 100%
SEO Codes: 89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 100%
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